Use of Electronic Test Equipment
In the the manufacturing process of all electronic components (Device), the discriminating needs is indispensable, this is actually a testing process. This process requires a variety of test equipment, such equipment is known as ATE (Automatic Test Equipment). The so-called electronic components (DUT) are including the IC categories, including discrete components, devices. ATE is used in all aspects of the procedures before (Front End) and after the procedure (Back End), depending on the requirements of the design process (Process). For example, the glow wire tester, is designed to carry out fire hazard testing on electronic products in accordance with the provisions of International standards.
The Role of Electronic Test Equipment
In the process of the components, according to the needs of the process, there are a variety of links need to be tested. The presence of part of the purpose is to filter defective products, to prevent their entry into the processes under one, and thus reduce the redundant manufacturing costs in the next process. These links need to be grasped through a variety of physical parameters, these parameters can be light, electricity, wave mechanics of various parameters in the reality of the physical world, however, at present, the most common is electronic signal. ATE design engineers to consider the most is such as time, phase, voltage, current, and other basic electronics physical parameters, which is the so-called "signal processing". In addition, such as LCD, PDP (plasma display) on the light-emitting part of the function test, then, depends on the optical-related parameters measured. I.e. The spring hammer is used to test the mechanical integrity of electronic products' enclosures according to different standards. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to electric shock and impact damage.
Core Function Structure of Electrical Test
There are two major structure categories of the electrical test: one is core test construction: inherited from the traditional electrical testing technology, detection technology, automatic implementation of signal processing (electronic signal measurement). Testing proposals for the DUT, the core test structures will be different. The other one is computer control constructs: processing speed and capacity, depending on the then computer capacity. Computer technology in fact has become a generic technology, a high index of computer is not necessarily the best computer for a set of ATE to meet the needs of the system, coordination is the best standard. In fact, the price of complex ATE equipment is relative to the price of advanced high-index server and the equivalent of a giant with dwarf.